2022 IEEE TCAD Acceptance - Gyungbin Kim, etc.

Author
comsys
Date
2022-01-24 12:16
Views
93
The following paper has been accepted in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems in January 2022.
Congratulations to the authors.
Title: SPAR: A New Test Point Insertion Using Shared Points for Area Overhead Reduction
Authors: Gyungbin Kim, Minho Cheong, and Sungho Kang