Publication - 2022 IEEE TCAD - Youngkwang Lee, etc.

Author
comsys
Date
2022-02-21 09:58
Views
71
In March 2022,
"Reduced-Pin-Count BOST for Test-Cost Reduction" written by Youngkwang Lee, Young-woo Lee, Sungyoul Seo, and Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.41, pp.750-761.

Authors' hard work has finally paid off !