Publication - 2021 IEEE Access - Donghyun Han, etc.

Author
comsys
Date
2021-10-07 11:37
Views
29
In October 2021,
"ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory" written by Donghyun Han, Hayoung Lee, Seungtaek Lee, and Sungho Kang has been published in the IEEE Access, vol.9, pp.133274-133288.

Authors' hard work has finally paid off !