2021 IEEE Access Acceptance - Hyungil Woo, etc.

Author
comsys
Date
2021-07-13 12:41
Views
104
The following paper has been accepted in the IEEE Access in July 2021.
Congratulations to the authors.
Title: A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-based Lock and Key
Authors: Hyungil Woo, Seokjun Jang and Sungho Kang