Publication - 2021 IEEE Access - Hyungil Woo, etc.

Author
comsys
Date
2021-07-28 09:49
Views
83
In July 2021,
"A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-based Lock and Key" written by Hyungil Woo, Seokjun Jang, and Sungho Kang has been published in the IEEE Access, vol.9, pp.102161-102176.

Authors' hard work has finally paid off !