Publication - 2017 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Publication - Jaeseok Park, et

Author
comsys
Date
2017-02-20 10:23
Views
501
In February 2017,
“FRESH: A New Test Result Extraction Scheme for Fast TSV Tests” written by Jaeseok Park, Hyunyul Lim, and Sungho Kang,
Has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.36, no.2, pp.336-345.

Authors' hard work has finally paid off !