Publication - 2017 IEEE Transactions on Computers Publication - Hyunggoy Oh, etc.

Author
comsys
Date
2016-12-22 15:38
Views
542
“An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time (Vol. 66, No.1, pp.38-44,
Jan. 2017)” has been published to IEEE Transactions on Computers.

Congratulations to the authors, Hyunggoy Oh, Taewoo Han, Inhyuk Choi, and Sungho Kang.