2017 ISQED Presentation

Author
comsys
Date
2017-03-27 10:08
Views
408
In March 2017, "Off-Chip Test Architecture for Improving Multi-Site Testing Efficiency using Tri-State Decoder and 3V-Level Encoder" written by Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, and Sungho Kang, has been presented in International Symposium on Quality Electronic Design.

Congratulations to the authors.