Publication - 2017 Journal of Semiconductor Technology and Science Publication - Jaewon Cha, etc.

Author
comsys
Date
2017-03-18 12:14
Views
438
In February 2017,
“Low Cost Endurance Test-pattern Generation for Multi-level Cell Flash Memory” written by Jaewon
Cha, Keewon Cho, Seunggeon Yu, Sungho Kang
has been published in the Journal of Semiconductor Technology and Science Publication, vol.17, no.1,
pp.147-155.

Authors' hard work has finally paid off !