2017 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Acceptance - Hayoung Lee, etc.

Author
comsys
Date
2017-09-21 11:59
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422
The following paper has been accepted in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, in September 2017.
Congratulations to the authors.
Title: Fault Group Pattern Matching with Efficient Early Termination for High-Speed Redundancy Analysis
Authors: Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang