2015년 3월 ISQED 발표
Author
comsys
Date
2015-03-12 17:38
Views
1200
The International Symposium on Quality Electronic Design (ISQED 2015) 에서
3편의 논문을 발표했습니다.
제목: A Scan Shifting Method based on Clock Gating of Multiple Groups for Low Power Scan Testing
저자: Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang
제목: Near Optimal Repair Rate Built-in Redundancy Analysis with Very Small Hardware Overhead
저자: Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang
제목: Low Power Scan Bypass Technique with Test Data Reduction
저자: Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
세 분 모두 수고하셨습니다!^^
3편의 논문을 발표했습니다.
제목: A Scan Shifting Method based on Clock Gating of Multiple Groups for Low Power Scan Testing
저자: Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang
제목: Near Optimal Repair Rate Built-in Redundancy Analysis with Very Small Hardware Overhead
저자: Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang
제목: Low Power Scan Bypass Technique with Test Data Reduction
저자: Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
세 분 모두 수고하셨습니다!^^