2016 IEEE TCAD Acceptance - Jaeseok Park, etc.

Author
comsys
Date
2016-06-09 10:24
Views
512
"FRESH: A New Test Result Extraction Scheme for Fast TSV Tests" has been accepted
to IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Congratulations to the authors, Jaeseok Park, Hyunyul Lim, and Sungho Kang.