2016 IEEE TVLSI Acceptance - Jaewon Cha, etc.

Author
comsys
Date
2016-10-28 16:33
Views
481
“Low Cost Endurance Test-pattern Generation for Multi-level Cell Flash Memory” has been accepted
to Journal of Semiconductor Technology and Science (JSTS).

Congratulations to the authors, Jaewon Cha, Keewon Cho, Seunggeon Yu, Sungho Kang.