2014년도 4월 IEEE TVLSI 논문게재 - 신효영외
Author
comsys
Date
2014-09-04 16:19
Views
1228
2014년도 4월 IEEE TVLSI에 논문게재 되었습니다.
제목 : "Interleaving Test Algorithm for Sub-threshold Leakage Current Defects in DRAM Considering the Equal Bit Line Stress"
저자 : Hyoyoung Shin, Youngkyu Park, Gihwa Lee, Jungsik Park, and Sungho Kang
축하드립니다~^^
제목 : "Interleaving Test Algorithm for Sub-threshold Leakage Current Defects in DRAM Considering the Equal Bit Line Stress"
저자 : Hyoyoung Shin, Youngkyu Park, Gihwa Lee, Jungsik Park, and Sungho Kang
축하드립니다~^^