Publication - 2018 IEEE Transactions on Computers - Inhyuk Choi, etc.

Author
comsys
Date
2018-11-30 13:27
Views
316
In December 2018.
"Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost" written by Inhyuk Choi, Hyunggoy Oh, Young-woo Lee, Sungho Kang.
has been published in the IEEE Transactions on Computers, vol.67, no.12, 1835-1839.

Authors' hard work has finally paid off !