Publication - 2023 IEEE TCAD - Sunghoon Kim, etc.

Author
comsys
Date
2023-07-20 10:48
Views
240
In July 2023,
"Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis" written by Sunghoon Kim; Seokjun Jang; Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.42, no.8, pp.2717-2727

Authors' hard work has finally paid off !