2022 IEEE TCAD Acceptance - Sunghoon Kim, etc.

Author
comsys
Date
2022-11-30 10:34
Views
265
The following paper has been accepted in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems in April 2022.
Congratulations to the authors.
Title: Scan Chain Architecture with Data Duplication for Multiple Scan Cell Fault Diagnosis
Authors: Sunghoon Kim, Seokjun Jang, Sungho Kang