Publication - 2022 IEEE TCAD - Gyungbin Kim, etc.

Author
comsys
Date
2022-11-23 16:48
Views
241
In November 2022,
"SPAR: A New Test Point Insertion Using Shared Points for Area Overhead Reduction" written by Gyungbin Kim, Minho Cheong, Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.41, no.11, pp.4939-4951.

Authors' hard work has finally paid off !