2022 IEEE TCAD Acceptance - Hyeonchan Lim, etc.

Author
comsys
Date
2022-03-30 16:45
Views
57
The following paper has been accepted in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems in March 2022.
Congratulations to the authors.
Title: A Hybrid Test Scheme for Automotive IC in Multi-site Testing
Authors: Hyeonchan Lim, Hyojoon Yun, and Sungho Kang