Publication - 2021 IEEE Access - Hayoung Lee, etc.

Author
comsys
Date
2021-04-19 09:55
Views
205
In April 2021,
"On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug" written by Hayoung Lee, Hyunggoy Oh, and Sungho Kang has been published in the IEEE Access, vol.9, pp.56443-56456.

Authors' hard work has finally paid off !