2021 IEEE Access Acceptance - Hayoung Lee, etc.

Author
comsys
Date
2021-04-01 11:52
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20
The following paper has been accepted in the IEEE Access in March 2021.
Congratulations to the authors.
Title: On-Chip Error Detection Reusing Built-in Self-Repair for Silicon Debug
Authors: Hayoung Lee, Hyunggoy Oh, and Sungho Kang