Computer Systems & Reliable SoC Lab.

Number	Title	Author	Date	Views
84	2017 IEEE Transactions on Reliability Acceptance - Hayoung Lee, etc.	comsys	2017.12.11	1598
83	2017 IEICE Electronics Express Acceptance - Heetae Kim, etc.	comsys	2017.12.11	1560
82	2017 ITC-Asia Presentation	comsys	2017.10.17	1594
81	2017 IEEE Transactions on Very Large Scale Integration Systems Acceptance - Donghyun Kim, etc.	comsys	2017.10.10	1573
80	2017 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Acceptance - Hayoung Lee, etc.	comsys	2017.09.21	1620
79	Publication - 2017 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Publication - Young-woo Lee, e	comsys	2017.09.19	1564
78	2017 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Acceptance - Jaeil Lim, etc.	comsys	2017.07.08	1674
77	Publication - 2017 Sensors Publication - Younsun Kim, etc.	comsys	2017.06.07	1641
76	Publication - 2017 IEEE Transactions on Reliability Publication - Jaeseok Park, etc.	comsys	2017.06.05	1619
75	2017 Sensors Acceptance - Younsun Kim, etc.	comsys	2017.06.02	1651

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