2020 IEEE Access Acceptance - Jihye Kim, etc.

Author
comsys
Date
2020-08-31 16:09
Views
50
The following paper has been accepted in the IEEE Access in August 2020.
Congratulations to the authors.
Title: Fine-Grained Defect Diagnosis for CMOL FPGA Circuits
Authors: Jihye Kim, Hayoung Lee, Seokjun Jang and Sungho Kang