Publication - 2018 IEEE Journal on Emerging and Selected Topics in Circuits and Systems - A Statistic-based Scan Chain Reorderi

Author
comsys
Date
2018-09-21 14:03
Views
24
In September 2018,
"A Statistic-based Scan Chain Reordering for Energy-Quality Scalable Scan Test" written by Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang.
has been pulbished in the IEEE Journal on Emerging and Selected Topics in Circuits and Systems, vol.8, no.3, pp.391-403.

Authors' hard work has finally paid off !