2024 IEEE TCAD Acceptance - Seokjun Jang, etc.
Author
comsys
Date
2024-08-01 10:53
Views
47
The following paper has been accepted in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems in July 2024.
Congratulations to the authors.
Title: PASS: Pattern-Sequence-Authentication-based Secure Scan against Reverse Engineering Attacks
Authors: Seokjun Jang, Youngki Moon, Duyeon Won, and Sungho Kang
Congratulations to the authors.
Title: PASS: Pattern-Sequence-Authentication-based Secure Scan against Reverse Engineering Attacks
Authors: Seokjun Jang, Youngki Moon, Duyeon Won, and Sungho Kang