2022 IEEE TCAD Acceptance - Youngkwang Lee, etc.

Author
comsys
Date
2022-04-27 09:46
Views
32
The following paper has been accepted in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems in April 2022.
Congratulations to the authors.
Title: Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture
Authors: Youngkwang Lee, Donghyun Han, Sooryeong Lee, and Sungho Kang