2021 IEEE Access Acceptance - Donghyun Han, etc.

Author
comsys
Date
2021-09-29 16:21
Views
39
The following paper has been accepted in the IEEE Access in September 2021.
Congratulations to the authors.
Title: ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory
Authors: Donghyun Han, Hayoung Lee, Seungtaek Lee, and Sungho Kang