Publication - 2021 IEEE Access - Jaewon Park, etc.

Author
comsys
Date
2021-04-01 11:48
Views
16
In February 2021,
"An In-DRAM BIST for 16 Gb DDR4 DRAM in the 2nd 10-nm-Class DRAM Process" written by Jaewon Park, Jae Hoon Lee, Sang-Kil Park, Ki Chul Chun, Kyomin Sohn, Sungho Kang has been published in the IEEE Access, vol.9, pp.33487-33497.

Authors' hard work has finally paid off !