Publication - 2020 IEEE Transactions on Circuits and Systems II: Express Briefs - Sangjun Lee, etc.

Author
comsys
Date
2021-02-23 20:21
Views
40
In December 2020,
"A New Logic Topology-based Scan Chain Stitching for Test-Power Reduction" written by Sangjun Lee, Kyunghwan Cho, Sungki Choi, and Sungho Kang has been published in the IEEE Transactions on Circuits and Systems II: Express Briefs, vol.67, no.12, pp.3432-3436.

Authors' hard work has finally paid off !