Publication - 2020 IEEE Access - Jihye Kim, etc.

Author
comsys
Date
2021-02-23 20:13
Views
6
In September 2020,
"Fine-Grained Defect Diagnosis for CMOL FPGA Circuits" written by Jihye Kim, Hayoung Lee, Seokjun Jang and Sungho Kang has been published in the IEEE Access, vol.8, pp.163140-163151.

Authors' hard work has finally paid off !