2026 International Patent - Hayoung Lee, etc.
Author
comsys
Date
2026-07-31 16:19
Views
18
The following patent has been approved by the World Intellectual Property Office in June 2026.
Congratulations to the authors.
Title: NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS
Authors: 강성호, 이하영
Congratulations to the authors.
Title: NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS
Authors: 강성호, 이하영