2026 IEEE TCAD Acceptance - Duyeon Won, etc.
Author
comsys
Date
2026-04-29 09:57
Views
51
The following paper has been accepted in the Transactions on Computer-Aided Design of Integrated Circuits and Systems in April 2026.
Congratulations to the authors.
Title: A Pre-Load Compression Using Test Vector Segmentation for High-Speed Memory Testing
Authors: Duyeon Won, Juyong Lee, Gyeonggyu Park, Youngki Moon, and Sungho Kang
Congratulations to the authors.
Title: A Pre-Load Compression Using Test Vector Segmentation for High-Speed Memory Testing
Authors: Duyeon Won, Juyong Lee, Gyeonggyu Park, Youngki Moon, and Sungho Kang