Publication - 2026 IEEE TCASI - Sangjun Lee, etc.
Author
comsys
Date
2026-01-15 10:10
Views
5
In January 2026,
"TOPS: Topology-Based Partial Scan for Stuck-At and Delay Testing" written by Sangjun Lee, Jongho Park, Jaeyoung Joung, Jaehyun Kim, Laesang Jung, and Sungho Kang has been published in the IEEE Transactions on Circuits and Systems I: Regular Papers, vol.73, no.1, pp.492-501.
Authors' hard work has finally paid off !
"TOPS: Topology-Based Partial Scan for Stuck-At and Delay Testing" written by Sangjun Lee, Jongho Park, Jaeyoung Joung, Jaehyun Kim, Laesang Jung, and Sungho Kang has been published in the IEEE Transactions on Circuits and Systems I: Regular Papers, vol.73, no.1, pp.492-501.
Authors' hard work has finally paid off !