2025 Domestic Patent - Hayoung Lee, etc.

Author
comsys
Date
2025-11-03 16:13
Views
62
The following patent has been approved by the Korean Intellectual Property Office in September 2025.
Congratulations to the authors.

Title: 비선형 메모리 고장 분석 방법 및 메모리 테스트 장치
Authors: 강성호, 이하영
2025 Domestic Patent - Youngkwang Lee, etc.
Publication - 2025 IEEE Access - Jongho Park, etc.
List
Powered by KBoard