Publication - 2025 IEEE Access - Jongho Park, etc.
Author
comsys
Date
2025-11-03 16:11
Views
63
In October 2025,
"A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency" written by Jongho Park, Sangjun Lee, Jaehyun Kim, Hanseong Cho, Nayeun Kim, and Sungho Kang has been published in the IEEE Access, vol.13, pp.180264-180275.
Authors' hard work has finally paid off !
"A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency" written by Jongho Park, Sangjun Lee, Jaehyun Kim, Hanseong Cho, Nayeun Kim, and Sungho Kang has been published in the IEEE Access, vol.13, pp.180264-180275.
Authors' hard work has finally paid off !