2025 IEEE Access Acceptance - Jongho Park, etc.
Author
comsys
Date
2025-11-03 16:10
Views
61
The following paper has been accepted in the IEEE Access in October 2025.
Congratulations to the authors.
Title: A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency
Authors: Jongho Park, Sangjun Lee, Jaehyun Kim, Hanseong Cho, Nayeun Kim, and Sungho Kang
Congratulations to the authors.
Title: A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency
Authors: Jongho Park, Sangjun Lee, Jaehyun Kim, Hanseong Cho, Nayeun Kim, and Sungho Kang