2025 IEEE TVLSI Acceptance - Sunghoon Kim, etc.
Author
comsys
Date
2025-10-02 11:46
Views
26
The following paper has been accepted in the IEEE Transactions on Very Large Scale Integration Systems in September 2025.
Congratulations to the authors.
Title: Test Cycle Reduction for TSV Test Using Streaming Scan Network on 3-D IC
Authors: Sunghoon Kim, Donghyun Han, Dayoung Kim, and Sungho Kang
Congratulations to the authors.
Title: Test Cycle Reduction for TSV Test Using Streaming Scan Network on 3-D IC
Authors: Sunghoon Kim, Donghyun Han, Dayoung Kim, and Sungho Kang