2025 IEEE TCASI Acceptance - Sangjun Lee, etc.
Author
comsys
Date
2025-09-02 11:25
Views
140
The following paper has been accepted in the IEEE Transactions on Circuits and Systems I: Regular Papers in August 2025.
Congratulations to the authors.
Title: TOPS: Topology-based Partial Scan for Stuck-at and Delay Testing
Authors: Sangjun Lee, Jongho Park, Jaeyoung Joung, Jaehyun Kim, Laesang Jung, and Sungho Kang
Congratulations to the authors.
Title: TOPS: Topology-based Partial Scan for Stuck-at and Delay Testing
Authors: Sangjun Lee, Jongho Park, Jaeyoung Joung, Jaehyun Kim, Laesang Jung, and Sungho Kang