Publication - 2025 IEEE TCAD - Hyojoon Yun, etc.
Author
comsys
Date
2025-09-02 11:24
Views
135
In September 2025,
"Multi-stage Enhanced Diagnosis with Fault Candidate Reduction" written byHyojoon Yun, Hyeonchan Lim, Hayoung Lee, and Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.44, no.9, 3648-3652.
Authors' hard work has finally paid off !
"Multi-stage Enhanced Diagnosis with Fault Candidate Reduction" written byHyojoon Yun, Hyeonchan Lim, Hayoung Lee, and Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.44, no.9, 3648-3652.
Authors' hard work has finally paid off !