Publication - 2025 IEEE TVLSI - Hayoung Lee, etc.
Author
comsys
Date
2025-05-01 09:39
Views
55
In May 2025,
"An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-In-Memory" written by Hayoung Lee, Juyong Lee, and Sungho Kang has been published in the IEEE Transactions on Very Large Scale Integration Systems, vol.33, no.5, pp.1452-1456.
Authors' hard work has finally paid off !
"An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-In-Memory" written by Hayoung Lee, Juyong Lee, and Sungho Kang has been published in the IEEE Transactions on Very Large Scale Integration Systems, vol.33, no.5, pp.1452-1456.
Authors' hard work has finally paid off !