Publication - 2025 IEEE TCAD - Joonsik Yoon, etc.
Author
comsys
Date
2025-05-01 09:39
Views
50
In May 2025,
"A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM" written by Joonsik Yoon, Hayoung Lee, Youngki Moon, Seung Ho Shin, and Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.44, no.5, pp.2014-2025.
Authors' hard work has finally paid off !
"A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM" written by Joonsik Yoon, Hayoung Lee, Youngki Moon, Seung Ho Shin, and Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.44, no.5, pp.2014-2025.
Authors' hard work has finally paid off !