Publication - 2025 IEEE TCAD - Hayoung Lee, etc.
Author
comsys
Date
2025-04-03 10:29
Views
50
In April 2025,
"A Robust Test Architecture for Low-Power AI Accelerators" written by Hayoung Lee, Juyong Lee, and Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.44, no.4, pp.1581-1594.
Authors' hard work has finally paid off !
"A Robust Test Architecture for Low-Power AI Accelerators" written by Hayoung Lee, Juyong Lee, and Sungho Kang has been published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.44, no.4, pp.1581-1594.
Authors' hard work has finally paid off !