2024 Domestic Patent - Sunghoon Kim, etc.

Author
comsys
Date
2024-07-03 09:49
Views
108
The following patent has been approved by the Korean Intellectual Property Office in May 2024.
Congratulations to the authors.

Title: 스캔 체인의 다중 고장 진단장치 및 방법

Authors: Sungho Kang, Sunghoon Kim
2024 IEEE TCAD Acceptance - Youngkwang Lee, etc.
2024 International Patent - Sangjun Lee, etc.
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