2023 International Patent - Seokjun Jang, etc.
Author
comsys
Date
2023-02-28 10:14
Views
225
The following patent has been approved by the World Intellectual Property Office in Febrary 2023.
Congratulations to the authors.
Title: SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD (높은 해상도를 위한 재구성 가능한 진단 경로에 기초한 스캔 구조)
Authors: Seokjun Jang, Sungho Kang
Congratulations to the authors.
Title: SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAGNOSIS METHOD (높은 해상도를 위한 재구성 가능한 진단 경로에 기초한 스캔 구조)
Authors: Seokjun Jang, Sungho Kang