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Computer Systems and Reliable SoC (system-on-chip) Lab was opened in 1994. Under the supervision of Dr. Sungho Kang, researches on various topics in SoC design and testing field are being carried out. We are focusing on the innovation on new technical trends in SoC and 3D IC (integrated circuit) design and testing which is one of the hottest areas in Information Technology.
The three main topics of the research are SoC Design, 3D IC Design and Test, Memory Test and Repair. In the lab, there are 8 research groups for design and test for SoC and 3D IC. The following is the list of research groups : 1) testable 3D IC design, 2) BIRA (built in repair analysis) for memories, 3) TSV (through silicon via) repair for 3D IC, 3) RPCT (reduced pin count testing) for SoC, 5) NTV (near threshold voltage) design and test, 6) HPC (high performance computing) system, 7) BOST (built off self test) system, and 8) Parallel Test.
During the last 20 years, the lab has produced 27 graduates with a Ph.D. and 78 with a master’s degree, and we currently have 14 Ph.D. candidates and 8 master’s candidates. We have over 140 international journal publications, 90 domestic journal publications, 380 conference presentations, 58 international/domestic patent registrations and 84 international/domestic patent applications, as the results of the researches. Quite a few books on design and test have also been published, and the book on ASIC (application specific integrated circuit) design experiment is currently being used as the textbook for a graduate lab course in our school.
Design and test environments such as high performance workstations, servers, EDA (electronic design automation) tools logic analyzers, desktop ATE (automatic test equipment) and others, which are crucial for trendy researches in various fields, are well established in this lab. Building on these environments, a numerous number of research projects have been and are being conducted, and some of their results have been produced as patents and technology transfers.
Furthermore, we had a leading role in the foundation of the Institute of Semiconductor Test of Korea Society (ISTK), which is providing an important ground for the technology information exchange on the research field of semiconductor testing. The Korean Test Conference (http://www.koreatest.or.kr) hosted by ISTK, which is the only conference specializing in semiconductor testing in Korea, is making a great contribution to the development of the semiconductor testing technology by providing opportunities for the academia, industry, semiconductor producers, and EDA companies to get together for technology information exchange.
Contact Us
3rd Engineering Bldg. Room C631
School of Electrical and Electronic Engineering
College of Engineering, Yonsei University
50 Yonsei-ro, Seodaemun-gu
Seoul 03722, KOREA
Telephone: 82-2-2123-7726
E-mail: comsys@soc.yonsei.ac.kr