● PERSONAL DETAILS
■ Name : Sungho Kang
■ Address : School of Electrical and Electronic Engineering
■■■■■■ Yonsei University 50 Yonsei-ro
■■■■■■ Seodaemun-gu, Seoul KOREA 03722
■ Phone : 82-2-2123-2775
■ E-mail : shkang@yonsei.ac.kr
■ Homepage : http://soc.yonsei.ac.kr/
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● RESEARCH INTERESTS
■ SOC/VLSI/3D IC Design
■ SOC/VLSI/3D IC Testing
■ SOC/VLSI/3D IC CAD
■ Design for Testability and Design for Yield
■ Fault Tolerant Computing
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● EDUCATION HISTORY
■ Sep 1989 – May 1992 : The University of Texas at Austin
■ ■ ■ ■ ■ ■ ■ ■ ■ ■ Ph.D. in Electrical and Computer Engineering
■ Sep 1986 – May 1988 : The University of Texas at Austin
■ ■ ■ ■ ■ ■ ■ ■ ■ ■ M.S in Electrical and Computer Engineering
■ Mar 1982 – Feb 1986 : Seoul National University
■ ■ ■ ■ ■ ■ ■ ■ ■ ■ B.S. in Control and Instrumentation Engineering Cum laude
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● WORK EXPERIENCES
■ Sep 1994 – Present : Yonsei University
■ ■ ■ ■ ■ ■ ■ ■ ■ Professor at the School of Electrical and Electronic Engineering
■ Aug 1992 – Jun 1994 : Motorola
■ ■■ ■ ■ ■ ■ ■ ■ ■ Senior Staff Engineer at SSDT
■ Oct 1989 – Jun 1992 : Schlumberger Inc.
■ ■ ■ ■ ■ ■■ ■ ■ ■Research Scientist at SLCS
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● PROFESSIONAL ACTIVITIES
■ 2010 – Present : The Institute of Electronics and Information Engineers
■ ■ ■■■ ■ ■ ■ Semiconductor Society (Planning Director)
■ 1987 – Present : IEEE, Senior Member
■ Jan 2014 – Dec 2016 : Institute of Semiconductor Test of Korea
■■■■■■ ■■ ■ ■ ■ President
■ May 2009 – Apr 2014 : National Research Foundation of Korea
■ ■ ■ ■ ■ ■ ■ ■ ■ ■ Grant Reviewer Manager
■ Jan 2008 – Dec 2010 : Institute of Semiconductor Test of Korea
■ ■ ■ ■ ■ ■ ■ ■ ■ ■ President
■ Mar 2006 – Feb 2011 : Advanced System IC Research Institute
■ ■ ■ ■ ■ ■ ■ ■ ■ ■Director
■ Sep 2002 – Aug 2010 : Next Generation New Technology Development Center
■ ■ ■ ■ ■ ■ ■ ■ ■ ■Director
■ Jan 2000 – Dec 2002 : Korea Test Association
■ ■ ■ ■ ■ ■ ■ ■ ■ ■Founder and Chairman
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● TEACHING
■ Undergraduate Courses
■ ■ – Digital Logic Design
■ ■ – Digital Systems Design
■ ■ – Computer Architecture
■ Graduate Courses
■ ■ – Testing and Design for Testability
■ ■ – Special Topics on Testing
■ ■ – IC CAD Lab.
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● SELECTED ACADEMIC HONORS AND AWARDS
■ Haedong Award, IEIE 2001
■ Scientist of the Month Award, Ministry of Education 2011
■ Contribution Award, IEIE 1997
■ Contribution Award, Korea Test Association 2003
■ Contribution Award, IEIE SOC Research Society 2006
■ Contribution Award, Institute of Semiconductor Test of Korea 2011
■ Best Paper Award, International SOC Design Conference
■ Best Paper Award, Korea Test Conference
■ Best Paper Award, SOC Design Conference
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