- DFR (Design For Robustness) for In-Memory Computing System
Mar. 1, 2022 – Feb. 28, 2025. National Research Foundation of Korea - Artificial intelligence-based tester technology for reducing test costs
Jul. 1, 2023 – Dec. 31, 2025, Ministry of Trade, Industry and Energy - Implementation of the Basic Core Technology for SoC Tester capable of High-Quality Parallel Testing
Apr. 1, 2022 – Dec. 31, 2024. Ministry of Trade, Industry and Energy - Research on system of test equipment for high speed memory(CK 8GHz, DQ 16Gbps)
Apr. 1, 2022 – Dec. 31, 2024. Ministry of Trade, Industry and Energy - Logic BIST(Built-In Self Test) for Automotive SoC
Mar. 1, 2022 – Feb. 28, 2025. Samsung Electronics - DFT-based Test Method for Memory Peripheral Circuit
Mar. 1, 2023 – Feb. 28, 2025. Samsung Electronics - Through-silicon via repair structure for minimizing signal delay
Mar. 1, 2023 – Feb. 28, 2025. Samsung Electronics - Layout-Aware Scan Chain Diagnosis for Yield Ramp-Up
Sep. 16, 2020 – Aug. 31, 2024. Samsung Electronics - Test Technology for Next-Generation Memory
Dec. 1, 2020 – Nov. 30, 2023. SK Hynix - Fusion Human Resource Education Center for Automotive System IC
Apr. 9, 2021 – Dec. 31, 2026. National Research Foundation of Korea
