- Design-for-testability for In-Memory Computing in AI Semiconductor
Apr. 1, 2025 – Dec. 31, 2027, Ministry of Trade, Industry and Energy - Plug & Play (P&P) Chiplet Integration Research Center
Aug. 1, 2024 – Apr. 30, 2030, National Research Foundation of Korea - Artificial intelligence-based tester technology for reducing test costs
Jul. 1, 2023 – Dec. 31, 2025, Ministry of Trade, Industry and Energy - Development of AI-Based Predictive Maintenance Technology for High Reliability Test
Sep. 1, 2024 – Dec. 31, 2028, Ministry of Trade, Industry and Energy - Research on Methodologies for Screening Defects in NAND Peripheral Circuits
Mar. 1, 2025 – Feb. 28, 2026, Samsung Electronics - Standard-Based High-Reliability Test Architecture for Heterogeneous Die
Jul. 1, 2025 – Jun. 30, 2026, Samsung Electronics - Development of Pattern Generation and Core Technologies for High-Speed Test Equipment
Apr. 1, 2024 – Mar. 31, 2026, SK Hynix - Fusion Human Resource Education Center for Automotive System IC
Apr. 9, 2021 – Dec. 31, 2026, National Research Foundation of Korea
