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34 |
"Dynamic Power Supply Current Test for CMOS SRAMs"
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33 |
"An Efficient Interconnect Test Using BIST Module in a Boundary Scan Environment"
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32 |
"A New Weight Set Generation Algorithm for Weighted Random Pattern Generation"
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31 |
"New Scan Design of Asynchronous Sequential Circuits"
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30 |
"At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks"
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29 |
"Weight Set Optimization for Weighted Random Pattern Generation"
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28 |
"A Split Walking One Sequence for Wiring Interconnections"
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27 |
"A New BIST for Diagnosis and Transparent Testing in High Density SRAMs"
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26 |
"An Efficient Bist Architecture for Boards with Multiple Scan Chains"
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