Design For Testability

Textbook :

None

References :

Digital Systems Testing and Testable Design
Digital Circuit Testing and Testabiltiy

 

Main Topics :
  • Design and Test
  • Fault Simulation and ATPG
  • Design for Testability
  • Scan
  • BIST
  • Boundary Scan
  • Testable Design
  • DFT for Memory
  • Analogue BIST
  • Microprocessor Testing

 

Grading :

Final
Midterm
Class Presentations
Project

25%
25%
10%
40%

Download :

Indexing
Built In Self Test
Compiler
DFT
Fault simulation
IDDQ
JTAG
Memory Testing
Scan Testing

[Systems Testing |Design Verification| |C Programming]
[CAD |Design For Testability |Digital Logic Design |Computer Architecture ]