112

"An Efficient Hardware Architecture of the A-star Algorithm for the Shortest Path Search Engine"
Woo-Jin Seo, Seung-Ho Ok, Jin-Ho Ahn, Sungho Kang, and Byungin Moon
International Joint Conference on INC, IMS, and IDC
1499-1502, Aug 2009

111

"Digital Background Self-calibration for High Resolution Analog to Digital Converters"
Kicheol Kim and Sungho Kang
ITC-CSCC
pp.695-696, Jul 2009

110

"A High-level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections"
Sunghoon Chun, Yongjoon Kim, Taejin Kim and Sungho Kang
Proceedings of IEEE VTS'09 - 27th VLSI Test Symposium
pp.152-157, May 2009

109

"Hybrid Communication-Aware Task Scheduling for Energy Minimization in On-Chip Multiprocessor"
HyunJin Kim, Seongyong Ahn, Hyejeong Hong, Hong-Sik Kim and Sungho Kang
Proceedings of Coolchips XII
pp.247-249, April 2009

108

"An Effective Parallel ALPG Using Instruction Unrolling for High Speed Memory Testing"
Hyunjun Yoon, Myung-Hoon Yang, Yongjoon Kim, Youngkyu Park, Jaeseok Park and Sungho Kang
Proceedings of international SOC Design Conference
pp.370-375, November 2008

107

"Path Delay Fault Diagnosis Using Path Scoring"
Yoseop Lim, Joohwan Lee and Sungho Kang
Proceedings of international SOC Design Conference
pp.199-202, November 2008

106

"Segmented Scan Architecture Using Segment Grouping for Test Cost Reduction"
Myung-Hoon Yang, Taejin Kim, Yongjoon Kim and Sungho Kang
Proceedings of international SOC Design Conference
pp.379-382, November 2008

105

"A heuristic method to reduce fault candidates for a speedy fault diagnosis"
Hyungjun Cho, Joohwan Lee and Sungho Kang
Proceedings of international SOC Design Conference
pp.200-203, November 2008

104

"Variable-Length Block Nine-Coded Compression Technique with Huffman Codes and Symbol Merging"
Jaewon Jang, Youbean Kim, Kicheol Kim, Incheol Kim, Hyeonuk Son and Sungho Kang
Proceedings of international SOC Design Conference
pp.210-213, November 2008

103

"An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-based Scheme"
Taejin Kim, Sunghoon Chun, Yongjoon Kim, Myung-Hoon Yang and Sungho Kang
Proceedings of 17th Asian Test Symposium
pp.1-6, November 2008


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